Aehr Test Systems · NASDAQ:AEHR
Aehr Test Systems — Stifel Investor Presentation Feb 2013
14 slides from Aehr Test Systems's conference presentation, February 2013
Slide 1: Setting the Test Standard for Tomorrow
Setting the Test Standard for Tomorrow Gayn Erickson, CEO Nasdaq: AEHR
Slide 2: Safe Harbor Statement
Safe Harbor Statement This presentation contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company’s products. Actual results may vary from projected results. These risks and uncertainties TM include
Slide 3: Aehr Test Systems (Nasdaq: AEHR)
Aehr Test Systems (Nasdaq: AEHR) Production Semiconductor Test & Burn-in For over 35 Years! Technology leader in massively parallel test & Packaged Part burn-in systems with 2,500 Test & Burn-in systems installed worldwide Unique full-wafer test & burn-in systems and Multiple Wafer contactors Te
Slide 4: Aehr Test based in Fremont, CA
Aehr Test based in Fremont, CA Headquarters & High Volume Manufacturing
Slide 5: Aehr Test Systems - WW Customer Base
Aehr Test Systems - WW Customer Base ASE GROUP Over 2500 systems shipped Worldwide! (Partial Customer List)
Slide 6: Market Drivers
Market Drivers Automotive IC growth in sensors, control, information, and entertainment has substantially higher requirements for initial quality and long term reliability Mobility smartphone and tablets drive increased test, quality, reliability, and environmental demands Shrinking process no
Slide 7: Aehr Test Product Families
Aehr Test Product Families Packaged Part Test Cost-effective, reliable & Burn-in Systems and highly configurable Test & Burn-in Systems -15 Unique solution for test Multiple Wafer Test & burn-in for KGD and & Burn-in Systems automotive applications and Contactors -1 Reduced cost of test Single Wafer
Slide 8: Aehr Burn-in & Test Innovations
Aehr Burn-in & Test Innovations Memory ATS-12000 MBT MTX ABTS-M Dynamic Test During APG Functional APG Functional Burn-in Burn-in Test & Burn-in Test & Burn-in 1977 1980s 1990s Today Logic ATS-12000 ATX MAX ABTS-L/P Dynamic Monitored Monitored Functional Burn-in Burn-in Burn-in Test & Burn-in
Slide 9: Addressing Test & Burn-in Needs
Addressing Test & Burn-in Needs ABTS Family of Packaged Part Test & Burn-in Systems 14 Customers on New Platform Automotive, Mobile Processors, Video/Graphics, 4G Comms, & High Power SOCs Proprietary family of high performance thermal chambers Turn-key solution for individual temperature con
Slide 10: Full-Wafer Test Evolution
Full-Wafer Test Evolution Systems 14 200mm Wafer Slots Single 300mm Wafer 15 300mm Wafer Slots Single/Multi 300mm Wafer Air thermal control Liquid Cooled Liquid Thermal Control Liquid /Air Cooled Full Algo PG Full Algo or JTAG/BIST Vector or Algo PG Vector with JTAG/BIST 1995 2002 2006 2009 2013/14
Slide 11: Multi-Wafer Test & Burn-in
Multi-Wafer Test & Burn-in Cost-effective Solution for Producing Known- Good-Die (KGD) Stacked and Multi-Chip Packages Zero-defect tolerant applications Production Proven Full-Wafer Burn-in Solution Protects wafers and probe cards with individual power channel over-current protection Hig
Slide 12: Addressing New Test Opportunities
Addressing New Test Opportunities FOX-1 Family of Single Wafer Test & Burn-in Systems Automotive KGD – Production functional, stress, and burn-in test of automotive ICs Low Cost Wafer Test – More test is moving to wafer with additional -1 DFT, BIST, and Higher Parallelism Turn-key Solutions in
Slide 13: Aehr: Positioned for Growth
Aehr: Positioned for Growth Aehr has solid IP, technology, and products and a large installed base of most of the largest semi companies Introduced new products that are highly competitive and address new market segments Test trends driven by mobility, automotive, and advanced process shrinks
Slide 14: Setting the Test Standard for Tomorrow
Setting the Test Standard for Tomorrow Gayn Erickson, [email protected]
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