Aehr Test Systems · NASDAQ:AEHR
Aehr Test Systems — Investor Presentation (September 2020)
18 slides from Aehr Test Systems's investor presentation, September 2020
Slide 1: Setting the Test Standard for Tomorrow
Setting the Test Standard for Tomorrow Nasdaq: AEHR Nasdaq: AEHR
Slide 2: Forward Looking Statements
Forward Looking Statements This presentation contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company’s products. Actual results may vary from projected results. These risks and uncertainties includ
Slide 3: Company Overview
Company Overview l Worldwide supplier of burn-in test equipment and pioneer of wafer level burn- in (“WLBI”) platform Production Semiconductor Test & l Leader in WLBI, stabilization, and infant mortality test which is being Burn-In for over 40 Years commercially adopted across multiple high-growth m
Slide 4: Worldwide Customer Base
Worldwide Customer Base Aehr has been a leader in burn-in test solutions for over 40 years with thousands of systems shipped worldwide (Partial Customer List) 4 Nasdaq: AEHR
Slide 5: WLBI vs. PPBI Test Flow Example
WLBI vs. PPBI Test Flow Example Packaged Part Burn-In Test Flow Die Test 1 Die Test 2 Packaging Pkg Test 1 PPBI Pkg Test 2 Aehr Test FOX-XP Die Test 1 with Burn-In Die Test 2 Packaging Pkg Test 1 Pkg Test 2 Wafer Level Burn-In Test Flow 5 Nasdaq: AEHR
Slide 6: Wafer Level Enabling Technology
Wafer Level Enabling Technology l Aehr’s FOX-XP is capable of both functional burn-in and test solutions by leveraging proprietary aligner and contactor technology l Multi-wafer technology enables customers to achieve an overall decrease in test equipment cost and fab footprint, while increasing die
Slide 7: FOX Family of Test & Burn-In Systems
FOX Family of Test & Burn-In Systems Wafer Level & Singulated Die Solutions for Engineering through Production ~CP ~NP Multi-Wafer & Singulated Die Single Wafer Engineering & NPI FOX-P WaferPak & DiePak Test & Burn-In Systems Test & Burn-In Systems Test & Burn-In Systems Contactors 7 Nasdaq: AEHR
Slide 8: Customer Momentum and Opportunities
Customer Momentum and Opportunities Recent Customer Momentum New Customer & Market Opportunities l Major new customer for very high-volume devices l Aehr engaged in over two dozen new customer in data center on Aehr proprietary WLBI applications for wafer level and singulated die test and burn-in wi
Slide 9: Market Drivers
Market Drivers Need for cost-efficient wafer level and singulated die burn-in & testing as well as new requirements in package part burn in are creating significant revenue opportunities in the following key markets l Data Center Infrastructure and unstoppable growth in Data Storage l Worldwide 5G I
Slide 10: Silicon Photonics
Silicon Photonics l Integrated laser devices directly on silicon transceiver drastically lowering the cost of fiber optic transceivers for data centers and the internet cloud are driving a new requirement and opportunity for wafer level and singulated die burn-in and test Silicon Photonics growth dr
Slide 11: Silicon Photonics Stabilization & Infant Mortality
Silicon Photonics Stabilization & Infant Mortality Silicon Photonics Market Opportunity l Silicon photonics provides wafer level integration and HVM scale -> disruptive cost advantage over discrete fiber optic transceivers l Wafer Level and Singulated Die/Module level Stabilization & Burn-in not onl
Slide 12: Automotive & EV Semiconductor Device Market
Automotive & EV Semiconductor Device Market l Automotive IC growth in sensors, control, information, and entertainment has substantially higher requirements for initial quality and long-term reliability l New high bandgap / high voltage semiconductors (like Silicon Carbide and Gallium Nitride) creat
Slide 13: Silicon Carbide and EV/HEV Module Market
Silicon Carbide and EV/HEV Module Market l High Voltage / Power Electric Automobile powertrains driving l Silicon Carbide is known in the industry to have very high bandgap Silicon Carbide semiconductors with high defect density and high infant mortality related substantially higher initial quality
Slide 14: Silicon Carbide Infant Mortality Market
Silicon Carbide Infant Mortality Market Silicon Carbide Market Opportunity l Silicon carbide wafers have very high defect density with low initial yield and high infant mortality (recognized industry wide) l Devices must by burned in at high temperatures to remove infant mortality for 48 - 100 hours
Slide 15: Burn-in at Module is Very Expensive on Yield
Burn-in at Module is Very Expensive on Yield Silicon Carbide Module with 8 Die Customers driving to move Silicon Carbide burn-in to Wafer Level 15 Nasdaq: AEHR
Slide 16: $1B Market Opportunity for AEHR
$1B Market Opportunity for AEHR l 2019 Packaged Part Burn in Systems Market: $218M l 2019 Packaged Part Burn-in Consumables Market: $540M l Estimated 2021 Wafer Level and Singulated Die Burn-in Systems, Consumables, and Material Handlers Market: $400M+ Packaged Part Burn in TAM source: VLSI Research
Slide 17: Key Takeaways
Key Takeaways l Pioneer of next generation technology platform for wafer level testing l Significant need for lower cost wafer level test / burn-in l Wafer level and singulated die test / burn-in being adopted by across multiple high-growth markets including Silicon Photonics and Silicon Carbide l O
Slide 18: Setting the Test Standard for Tomorrow
Setting the Test Standard for Tomorrow Nasdaq: AEHR Nasdaq: AEHR
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